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Evaluation of effective stress times and stress levels from mission profiles for semiconductor reliability

Hirler, A., Biba, J., Alsioufy, A., Lehndorff, T., Sulima, T., Lochner, H., Abelein, U., Hansch, W.

Journal:

Microelectronics Reliability

Année:

2017

Langue:

english

Fichier:

PDF, 687 KB

english, 2017

Avalanche breakdown capability of Power DMOS Transistors and the Wunsch-Bell relation

A.Icaza Deckelmann, G. Wachutka, F. Hirler, J. Krumrey, R. Henninger

Journal:

Microelectronics Reliability

Année:

2003

Fichier:

PDF, 1.02 MB

2003

[IEEE 2005 IEEE 11th European Conference on Power Electronics and Applications - Dresden, Germany ()] 2005 European Conference on Power Electronics and Applications - A new robust power MOSFET family in the voltage range 80 V-150 V with superior low R/sub Dson/, excellent switching properties and improved body diode

Schogl, A., Hirler, F., Ropohl, J., Hiller, U., Rosch, M., Soufi-Amlashi, N., Siemieniec, R.

Année:

2005

Langue:

english

Fichier:

PDF, 2.43 MB

english, 2005

[IEEE 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) - Vienna, Austria (2020.9.13-2020.9.18)] 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) - Simulation of a Short-Circuit Rugged Trench IGBT with a JFET Connected to a SiC Schottky Rectifier

Arnold, Thorsten, Elpelt, Rudolf, Thees, Hans-Jurgen, Imperiale, Ilaria, Philippou, Alexander, Hirler, Franz, Hauf, Moritz, Baburske, Roman, Sandow, Christian

Année:

2020

Fichier:

PDF, 1.54 MB

2020

[Inst. Electr. Eng. Japan International Symposium on Power Semiconductor Devices and IC's - Kyoto, Japan (3-6 June 1998)] Proceedings of the 10th International Symposium on Power Semiconductor Devices and ICs. ISPSD'98 (IEEE Cat. No.98CH36212) - 1200 V-trench-IGBT study with square short circuit SOA

Laska, T., Pfirsch, F., Hirler, F., Niedermeyr, J., Schaffer, C., Schmidt, T.

Année:

1998

Langue:

english

Fichier:

PDF, 586 KB

english, 1998

Experimental study and simulations on two different avalanche modes in trench power MOSFETs

Pawel, I., Siemieniec, R., Rosch, M., Hirler, F., Herzer, R.

Journal:

IET Circuits Devices & Systems

Année:

2007

Langue:

english

Fichier:

PDF, 417 KB

english, 2007

[IEEE 2006 12th International Power Electronics and Motion Control Conference - Portoroz (2006.08.30-2006.09.1)] 2006 12th International Power Electronics and Motion Control Conference - A New Fast and Rugged 100 V Power MOSFET

Siemieniec, R., Hirler, F., Schlogl, A., Rosch, M., Soufi-Amlashi, N., Ropohl, J., Hiller, U.

Année:

2006

Langue:

english

Fichier:

PDF, 421 KB

english, 2006

[IEEE ESSDERC 2003. 33rd European Solid-State Device Research - ESSDERC '03 - Estoril, Portugal (16-18 Sept. 2003)] Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710) - Failure of multiple-cell power DMOS transistors in avalanche operation

Deckelmann, A.C., Wachutka, G., Hirler, F., Krumrey, J., Henninger, R.

Année:

2003

Langue:

english

Fichier:

PDF, 268 KB

english, 2003

As quantum wells and quantum wires

Hofmann, D. M., Drechsler, M., Wetzel, C., Meyer, B. K., Hirler, F., Strenz, R., Abstreiter, G., Böhm, G., Weimann, G.

Journal:

Physical Review B

Année:

1995

Langue:

english

Fichier:

PDF, 271 KB

english, 1995

As wires

Hirler, F., Zrenner, A., Strenz, R., Abstreiter, G., Böhm, G., Weimann, G.

Journal:

Physical Review B

Année:

1995

Langue:

english

Fichier:

PDF, 412 KB

english, 1995

[IEEE IC's (ISPSD) - Barcelona, Spain (2009.06.14-2009.06.18)] 2009 21st International Symposium on Power Semiconductor Devices & IC's - YFET - Trench superjunction process window extended

Hirler, Franz, Kapels, Holger

Année:

2009

Langue:

english

Fichier:

PDF, 235 KB

english, 2009

[IEEE 2003 IEEE Conference on Electron Devices and Solid-State Circuits - Hong Kong, China (16-18 Dec. 2003)] 2003 IEEE Conference on Electron Devices and Solid-State Circuits (IEEE Cat. No.03TH8668) - Failure of power DMOS transistor arrays under unclamped inductive switching stress conditions

Deckelmann, A.I., Wachutka, G., Krumrey, J., Hirler, F., Henninger, R.

Année:

2003

Langue:

english

Fichier:

PDF, 266 KB

english, 2003

Double-chip protein arrays: force-based multiplex sandwich immunoassays with increased specificity

Kerstin Blank, Andreas Lankenau, Thao Mai, Susanne Schiffmann, Ilka Gilbert, Siegfried Hirler, Christian Albrecht, Martin Benoit, Hermann E. Gaub, Hauke Clausen-Schaumann

Journal:

Analytical and Bioanalytical Chemistry

Année:

2004

Langue:

english

Fichier:

PDF, 402 KB

english, 2004

[IEEE 8th International Symposium on Power Semiconductor Devices and ICs. ISPSD '96. Proceedings - Maui, HI, USA (20-23 May 1996)] 8th International Symposium on Power Semiconductor Devices and ICs. ISPSD '96. Proceedings - Optimizing the vertical IGBT structure-the NPT concept as the most economic and electrically ideal solution for a 1200 V-IGBT

Laska, T., Fugger, J., Hirler, F., Scholz, W.

Année:

1996

Langue:

english

Fichier:

PDF, 306 KB

english, 1996

Spatially direct and indirect optical transitions in shallow etched GaAs/AlGaAs quantum wires

F. Hirler, R. Küchler, R. Strenz, G. Abstreiter, G. Böhm, J. Smoliner, G. Tränkle, G. Weimann

Journal:

Surface Science

Année:

1992

Langue:

english

Fichier:

PDF, 438 KB

english, 1992

Tunneling processes between quantum wires and two-dimensional electron states

J. Smoliner, W. Demmerle, F. Hirler, E. Gornik, G. Böhm, G. Weimann

Journal:

Surface Science

Année:

1992

Langue:

english

Fichier:

PDF, 401 KB

english, 1992

Information on the confinement potential in GaAsAlGaAs wires from magnetoluminescence experiments

F. Hirler, R. Strenz, R. Küchler, G. Abstreiter, G. Böhm, G. Weiman

Journal:

Surface Science

Année:

1994

Langue:

english

Fichier:

PDF, 555 KB

english, 1994

One-dimensional charge density determination in shallow etched quantum wires

Smoliner, J, Berthold, G, Hirler, F, Reinacher, N

Journal:

Semiconductor Science and Technology

Année:

1991

Langue:

english

Fichier:

PDF, 329 KB

english, 1991

CORRESPONDENTS.

Dörr, Wolfgang, Hirler, Erwin, Hönig, Michaela

Journal:

The Lancet

Année:

1845

Langue:

english

Fichier:

PDF, 433 KB

english, 1845

Response of mouse tongue epithelium to single doses of bleomycin and radiation

Dörr, Wolfgang, Hirler, Erwin, Hönig, Michaela

Journal:

Radiotherapy and Oncology

Année:

1993

Langue:

english

Fichier:

PDF, 732 KB

english, 1993

[IEEE 2007 European Conference on Power Electronics and Applications - Aalborg, Denmark (2007.09.2-2007.09.5)] 2007 European Conference on Power Electronics and Applications - Design of avalanche capability of Power MOSFETs by device simulation

Pawel, I., Siemieniec, R., Rosch, M., Hirler, F., Geissler, C., Pugatschow, A., Balk, L.J.

Année:

2007

Langue:

english

Fichier:

PDF, 840 KB

english, 2007

Single-Particle Excitations in Quasi-Zero- and Quasi-One-Dimensional Electron Systems

Strenz, R., Bockelmann, U., Hirler, F., Abstreiter, G., Böhm, G., Weimann, G.

Journal:

Physical Review Letters

Année:

1994

Langue:

english

Fichier:

PDF, 541 KB

english, 1994

[IEEE ASDAM'02 (4th International Conference on Advanced Semiconductor Devices and Microsystems) - Smolenice Castle, Slovakia (14-16 Oct. 2002)] The Fourth International Conference on Advanced Semiconductor Devices and Microsystem - Failure mechanism of power DMOS transistors under UIS stress conditions

Icaza-Deckelmann, A., Wachutka, G., Krumrey, J., Hirler, F.

Année:

2002

Langue:

english

Fichier:

PDF, 220 KB

english, 2002

Tunneling processes between Landau levels and quantum-wire states

Smoliner, J., Demmerle, W., Hirler, F., Gornik, E., Weimann, G., Hauser, M., Schlapp, W.

Journal:

Physical Review B

Année:

1991

Langue:

english

Fichier:

PDF, 163 KB

english, 1991

Energy levels in quantum wires studied by tunneling and magnetotransport experiments

Hirler, F., Smoliner, J., Gornik, E., Weimann, G., Schlapp, W.

Journal:

Applied Physics Letters

Année:

1990

Langue:

english

Fichier:

PDF, 550 KB

english, 1990

Spatially direct and indirect optical transitions in shallow etched GaAs/AlGaAs wires, dots and antidots

Hirler, F, Strenz, R, Kuchler, R, Abstreiter, G, Bohm, G, Smoliner, J, Trankle, G, Weimann, G

Journal:

Semiconductor Science and Technology

Année:

1993

Langue:

english

Fichier:

PDF, 396 KB

english, 1993

[IEEE 32nd European Solid-State Device Research Conference - Firenze, Italy (2002.9.24-2002.9.26)] 32nd European Solid-State Device Research Conference - UIS-Failure of DMOS Power Transistors

Deckelmann, A.I., Wachutka, G., Hirler, F., Krumrey, J.

Année:

2002

Langue:

english

Fichier:

PDF, 504 KB

english, 2002

Confined plasmons in shallow etched quantum wires

R. Strenz, V. Rosskopf, F. Hirler, G. Abstreiter, G. Bohm, G. Trankle, G. Weimann

Année:

1994

Langue:

english

Fichier:

PDF, 363 KB

english, 1994

Interplay of one- and two-dimensional systems

Berthold, G, Smoliner, J, Demmerle, W, Hirler, F, Gornik, E, Ettmuller, W, Bohm, G, Weimann, G

Journal:

Semiconductor Science and Technology

Année:

1991

Langue:

english

Fichier:

PDF, 270 KB

english, 1991

Tunnelling processes between quantum wires and a two-dimensional electron gas

Smoliner, J, Hirler, F, Gornik, E, Weimann, G, Hauser, M, Schlapp, W

Journal:

Semiconductor Science and Technology

Année:

1991

Langue:

english

Fichier:

PDF, 305 KB

english, 1991

Correlated Chemical And Electrically Active Dopant Analysis In Catalyst-Free Si-Doped InAs Nanowires

Becker, Jonathan, Hill, Megan O, Sonner, Max, Treu, Julian, Döblinger, Markus, Hirler, Alexander, Riedl, Hubert, Finley, Jonathan J., Lauhon, Lincoln, Koblmueller, Gregor

Journal:

ACS Nano

Année:

2018

Langue:

english

Fichier:

PDF, 1.52 MB

english, 2018

[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Alternating Temperature Stress and Deduction of Effective Stress Levels from Mission Profiles for Semiconductor Reliability

Hirler, A., Alsioufy, A., Biba, J., Lehndorff, T., Lipp, D., Lochner, H., Siddabathula, M., Simon, S., Sulima, T., Wiatr, M., Hansch, W.

Année:

2019

Langue:

english

Fichier:

PDF, 407 KB

english, 2019

[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Alternating Temperature Stress and Deduction of Effective Stress Levels from Mission Profiles for Semiconductor Reliability

Hirler, A., Alsioufy, A., Biba, J., Lehndorff, T., Lipp, D., Lochner, H., Siddabathula, M., Simon, S., Sulima, T., Wiatr, M., Hansch, W.

Année:

2019

Fichier:

PDF, 407 KB

2019

Effective and combined stressors from multi-dimensional mission profiles for semiconductor reliability

Hirler, A., Alsioufy, A., Biba, J., Lehndorff, T., Lochner, H., Simon, S., Sulima, T., Thomas, W., Hansch, W.

Journal:

Microelectronics Reliability

Année:

2019

Langue:

english

Fichier:

PDF, 1.37 MB

english, 2019

Experimental reliability study of cumulative damage models on state-of-the-art semiconductor technologies for step-stress tests and mission profile stresses

Hirler, A., Biba, J., Lipp, D., Lochner, H., Siddabathula, M., Simon, S., Sulima, T., Wiatr, M., Hansch, W.

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Année:

2020

Fichier:

PDF, 2.02 MB

2020